Webb飞行时间二次离子质谱(tof-sims),也叫静态二次离子质谱,是飞行时间和二次离子质谱结合的一种新的表面分析技术。tof-sims具有高分辨、高灵敏度、精确质量测定等性能,是目前高技术领域广泛使用的分析技术。 此外,tof-sims是非常灵敏的表面分析手段。 WebbFIB-SIMS inherently produces three-dimensional images, and it is very well suited to obtaining depth profiles from small areas (especially if quantification is not essential). …
表面分析技术详解:飞行时间二次离子质谱(TOF-SIMS) - 知乎
Webb25 maj 2010 · Synchrotron-based photoemission electron microscopy (PEEM; probing the surface region) and time-of-flight secondary ion mass spectrometry (ToF-SIMS; probing the uppermost surface layer) have been used to image naturally heterogeneous samples containing chalcopyrite (CuFeS 2), pentlandite [(Ni,Fe) 9 S 8] and monoclinic pyrrhotite … Webb11 apr. 2024 · In this study, the sensitivities of phospholipids mixed with aliphatic carboxylic acids were investigated using Bi-cluster time-of-flight SIMS (TOF-SIMS). Trans -aconitic acid (tri-carboxylic acid) and citric acid (hydroxycarboxylic acid) were used as the matrices. 2,5-Dihydroxybenzoic acid (DHB), which is a typical aromatic MALDI matrix, … infant floor activity mat
tofsims package - RDocumentation
WebbToF-SIMS involves sputtering the sample area of interest with a pulsed beam of bismuth primary ions (Bin+ where n = 1-3). Elemental and molecular fragment ions formed at the surface are mass-analyzed to produce data in the form of mass spectra, chemical images or depth profiles. WebbThe TOF SIMS analysis capability includes full spectral analysis, pixel by pixel across the sample image. The SIMS PC data system, MASsoft Professional, includes a simple user-configurable interface for control and data acquisition, including set up and control of the primary ion beam rastering for surface analysis and depth profile applications. Webb12 apr. 2024 · Ongoing challenges for 3D ToF-SIMS imaging are also discussed along with recent developments that might offer improved 3D imaging prospects in the near future. View. Show abstract. infant floor bed cheap